X-Ray Diffraction Techniques in MIT OCW 3.091SC

First-principles explanation of diffraction for phase identification.

Use for: Characterization Workflows for Synthesis Feedback. Method focus: characterization feedback. Material family: general materials. Validation: XRD / diffraction / phase identification. Safety note: Check SDS, institutional SOPs, equipment limits, and waste rules before use.

Citation: X-Ray Diffraction Techniques in MIT OCW 3.091SC. Materials synthesis resource. https://ocw.mit.edu/courses/3-091sc-introduction-to-solid-state-chemistry-fall-2010/pages/crystalline-materials/18-x-ray-diffraction-techniques/

Acknowledgement: Curated by MaterialsAtlas Open Resources from open courses, protocols, official documentation, scholarly papers, datasets, safety references, and synthesis-planning resources.