MaterialsAtlas Synthesis Resource
X-Ray Photoelectron Spectroscopy Primer
synthesismaterials-synthesisopen-resourcescharacterization-workflows-for-synthesis-feedbackprimercharacterizationcharacterization-feedbackthin-films-interfaces
Surface chemistry, oxidation states, contamination, and depth profiling.
Use for: Characterization Workflows for Synthesis Feedback. Method focus: characterization feedback. Material family: thin films / interfaces. Validation: XPS / surface analysis; Raman/FTIR/X-ray spectroscopy. Safety note: Check SDS, institutional SOPs, equipment limits, and waste rules before use.
Citation: X-Ray Photoelectron Spectroscopy Primer. Materials synthesis resource. https://en.wikipedia.org/wiki/X-ray_photoelectron_spectroscopy
Acknowledgement: Curated by MaterialsAtlas Open Resources from open courses, protocols, official documentation, scholarly papers, datasets, safety references, and synthesis-planning resources.